IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

《Ieee Design & Test》是一本由IEEE Computer Society出版商出版的專業(yè)工程技術期刊，該刊創(chuàng)刊于2013年，刊期6 issues/year，該刊已被國際權威數(shù)據(jù)庫SCIE收錄。在中科院最新升級版分區(qū)表中，該刊分區(qū)信息為大類學科：工程技術4區(qū)，小類學科：計算機：硬件 4區(qū)；工程：電子與電氣 4區(qū)；在JCR（Journal Citation Reports）分區(qū)等級為Q3。該刊發(fā)文范圍涵蓋COMPUTER SCIENCE, HARDWARE & ARCHITECTURE等領域，旨在及時、準確、全面地報道國內(nèi)外COMPUTER SCIENCE, HARDWARE & ARCHITECTURE工作者在該領域取得的最新研究成果、工作進展及學術動態(tài)、技術革新等，促進學術交流，鼓勵學術創(chuàng)新。2023年影響因子為1.9，平均審稿速度 。